INFLUENCE OF TESTER, TEST METHOD, AND DEVICE TYPE ON CDM ESD TESTING

被引：6

作者：

VERHAEGE, K ^{[1
]}

GROESENEKEN, GV ^{[1
]}

MAES, HE ^{[1
]}

EGGER, P ^{[1
]}

GIESER, H ^{[1
]}

机构：

[1] IFT,MUNICH,GERMANY

来源：

IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A | 1995年 / 18卷 / 02期

关键词：

D O I：

10.1109/95.390307

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, the charged device model (CDM) electrostatic discharge (ESD) events emulated by different commercial are studied, First, the characteristic waveforms, defined by the EOS/ESD CDM ESD draft standard (DS5.3-1993) [1], are compared and some major problems related to the specification of socketed CDM testers are discussed, Second, the results of an extensive CDM ESD test program are reported. The influences of various test parameters, such as the charging method (direct or field), the discharge mode (contact or noncontact), the charge pin (substrate pin or pin to be discharged) and the device package are studied, Finally, correlations of CDM ESD test results (the voltage thresholds and electrical failure signatures) are investigated.

引用

页码：284 / 294

页数：11