ABSOLUTE MEASUREMENTS OF LATTICE SPACINGS IN SURFACE-LAYERS OF CRYSTALS

被引：5

作者：

GOLOVIN, AL

IMAMOV, RM

KONDRASHKINA, EA

机构：

[1] Acad of Sciences of the USSR, Inst, of Crystallography, Moscow, USSR, Acad of Sciences of the USSR, Inst of Crystallography, Moscow, USSR

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 89卷 / 01期

关键词：

CRYSTALS - X-Ray Analysis;

D O I：

10.1002/pssa.2210890145

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The authors studied perfect InSb wafers with the surface normal parallel to left bracket 111 right bracket . The penetration depth of X-rays into the crystal in the total reflection diffraction geometry is as small as about 1 to 10 nm, which provides the means to explore the structural perfection of thin subsurface layers.

引用

页码：K5 / K7

页数：3