HIGH-FREQUENCY PERFORMANCE OF SI1-XGEX/SI1-YGEY/SI1-XGEXHBTS

被引：2

作者：

ROSENFELD, D ^{[1
]}

ALTEROVITZ, SA ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,FAC ELECT ENGN,HAIFA,ISRAEL

来源：

ELECTRONICS LETTERS | 1993年 / 29卷 / 03期

关键词：

BIPOLAR DEVICES; TRANSISTORS; SEMICONDUCTOR DEVICES AND MATERIALS;

D O I：

10.1049/el:19930178

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The results of a theoretical study of the performance of high speed SiGe HBTs is presented. The study includes a group of SiGe HBTs in which the Ge concentration in the base is 20% higher than that in the emitter and collector (i.e. y = x + 0.2). It is shown that the composition dependences of f(T) and the f(max) are non-monotonic. As the Ge composition in the emitter and collector layers is increased, f(T) and f(max) first decrease, then remain constant and finally increase to attain their highest values.

引用

页码：260 / 261

页数：2