HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：0
作者：
BARRY, JC [1 ]
ANSTIS, GR [1 ]
机构：
[1] UNIV TECHNOL SYDNEY,DEPT APPL PHYS,SYDNEY,NSW 2007,AUSTRALIA
来源：
MATERIALS FORUM | 1994年 / 18卷
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High resolution transmission electron microscopy (HRTEM) is a powerful tool for the study of microstructure in crystals. HRTEM is used to identify the relationship between microstructure and properties in materials, and to identify the nature of defect interactions. in this paper we discuss the principles and practice of HRTEM, we discuss examples of the application of HRTEM in materials science, and also we present a review of recent developments in HRTEM.
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页码：31 / 50
页数：20
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