FIELD-ION ENERGY DEFICITS IN THE ATOM PROBE FIM

[1] TEMPERATURE EFFECTS ON APPEARANCE POTENTIALS OF GAS-PHASE FIELD IONS [J]. SURFACE SCIENCE, 1978, 78 (02) : 307 - 323

[2] ERNST E, 1974, SURFACE SCI, V80, P645

[3] GENERALIZED THEORY OF STANDARD FIELD-ION APPEARANCE ENERGIES [J]. SURFACE SCIENCE, 1976, 61 (01) : 221 - 240

[4] Goldenfield I. V., 1974, International Journal of Mass Spectrometry and Ion Physics, V13, P297, DOI 10.1016/0020-7381(74)83011-1

[5] HUMMEL E, 1978, Z NATURFORSCH A, V34, P46

[6] MASS SPECTROMETRIC ANALYSIS OF IONS FROM THE FIELD MICROSCOPE [J]. JOURNAL OF CHEMICAL PHYSICS, 1954, 22 (07) : 1279 - 1280

[7] ENERGY SPREADS IN FIELD EVAPORATION AND LIQUID-METAL ION SOURCES [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 179 - 182

[8] ENERGY-DISTRIBUTIONS OF PULSED-LASER FIELD-DESORBED GASEOUS-IONS AND FIELD-EVAPORATED METAL-IONS - A DIRECT TIME-OF-FLIGHT MEASUREMENT [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 529 - 542

[9] PULSED-LASER-STIMULATED FIELD-ION EMISSION FROM METAL AND SEMICONDUCTOR SURFACES - A TIME-OF-FLIGHT STUDY OF THE FORMATION OF ATOMIC, MOLECULAR, AND CLUSTER IONS [J]. PHYSICAL REVIEW B, 1984, 30 (09): : 4946 - 4961

[10] CRITICAL ENERGY DEFICIT OF FIELD EMITTED IONS [J]. SURFACE SCIENCE, 1977, 65 (01) : 109 - 123

[1] TEMPERATURE EFFECTS ON APPEARANCE POTENTIALS OF GAS-PHASE FIELD IONS [J]. SURFACE SCIENCE, 1978, 78 (02) : 307 - 323

[2] ERNST E, 1974, SURFACE SCI, V80, P645

[3] GENERALIZED THEORY OF STANDARD FIELD-ION APPEARANCE ENERGIES [J]. SURFACE SCIENCE, 1976, 61 (01) : 221 - 240

[4] Goldenfield I. V., 1974, International Journal of Mass Spectrometry and Ion Physics, V13, P297, DOI 10.1016/0020-7381(74)83011-1

[5] HUMMEL E, 1978, Z NATURFORSCH A, V34, P46

[6] MASS SPECTROMETRIC ANALYSIS OF IONS FROM THE FIELD MICROSCOPE [J]. JOURNAL OF CHEMICAL PHYSICS, 1954, 22 (07) : 1279 - 1280

[7] ENERGY SPREADS IN FIELD EVAPORATION AND LIQUID-METAL ION SOURCES [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 179 - 182

[8] ENERGY-DISTRIBUTIONS OF PULSED-LASER FIELD-DESORBED GASEOUS-IONS AND FIELD-EVAPORATED METAL-IONS - A DIRECT TIME-OF-FLIGHT MEASUREMENT [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 529 - 542

[9] PULSED-LASER-STIMULATED FIELD-ION EMISSION FROM METAL AND SEMICONDUCTOR SURFACES - A TIME-OF-FLIGHT STUDY OF THE FORMATION OF ATOMIC, MOLECULAR, AND CLUSTER IONS [J]. PHYSICAL REVIEW B, 1984, 30 (09): : 4946 - 4961

[10] CRITICAL ENERGY DEFICIT OF FIELD EMITTED IONS [J]. SURFACE SCIENCE, 1977, 65 (01) : 109 - 123