FIELD-ION ENERGY DEFICITS IN THE ATOM PROBE FIM

被引：0

|

作者：

FORBES, RG

机构：

来源：

JOURNAL DE PHYSIQUE | 1986年 / 47卷 / C-2期

关键词：

D O I：

10.1051/jphyscol:1986205

中图分类号：

学科分类号：

摘要：

引用

收藏

页码：31 / 36

页数：6

相关论文

共 50 条

[1] FIELD-ION ATOM PROBE ANALYSIS
TURNER, PJ
REGAN, BJ
SOUTHON, MJ
SURFACE SCIENCE, 1973, 35 (01) : 336 - 344
[2] FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS
HUTTEN, A
HAASEN, P
JOURNAL OF APPLIED PHYSICS, 1987, 61 (08) : 3769 - 3771
[3] ATOM-PROBE FIELD-ION MICROSCOPY
MULLER, EW
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01): : 89 - &
[4] ATOM-PROBE FIELD-ION MICROSCOPY
LEISCH, M
MIKROCHIMICA ACTA, 1992, 107 (3-6) : 95 - 104
[5] ATOM-PROBE FIELD-ION MICROSCOPY
MILLER, MK
VACUUM, 1994, 45 (6-7) : 819 - 831
[6] ATOM PROBE FIELD-ION MICROSCOPY APPLICATIONS
CAMUS, PP
HIGH TEMPERATURE SCIENCE, 1989, 26 : 131 - 142
[7] Atom probe field-ion microscopy applications
Camus, Patrick P.
High temperature science, 1988, 26 (pt 1): : 131 - 142
[8] ATOM-PROBE FIELD-ION MICROSCOPY
TSONG, TT
PHYSICS TODAY, 1993, 46 (05) : 24 - 31
[9] The development of atom probe field-ion microscopy
Miller, MK
MATERIALS CHARACTERIZATION, 2000, 44 (1-2) : 11 - 27
[10] DERIVATION OF SURFACE-ATOM POLARIZABILITY FROM FIELD-ION ENERGY DEFICITS
FORBES, RG
APPLIED PHYSICS LETTERS, 1980, 36 (09) : 739 - 740

← 1 2 3 4 5 →