SPECIMEN PREPARATION METHODS FOR THE EXAMINATION OF SURFACES AND INTERFACES IN THE TRANSMISSION ELECTRON-MICROSCOPE

被引：102
作者：
NEWCOMB, SB
BOOTHROYD, CB
STOBBS, WM
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 140卷
关键词：
D O I：
10.1111/j.1365-2818.1985.tb02675.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：195 / 207
页数：13
相关论文
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