ANALYTICAL REDUNDANCY AND THE DESIGN OF ROBUST FAILURE-DETECTION SYSTEMS

被引：689

作者：

CHOW, EY ^{[1
]}

WILLSKY, AS ^{[1
]}

机构：

[1] MIT,INFORMAT & DECIS SYST LAB,CAMBRIDGE,MA 02139

来源：

关键词：

D O I：

10.1109/TAC.1984.1103593

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：603 / 614

页数：12

共 20 条

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[J]. JOURNAL OF SPACECRAFT AND ROCKETS, 1970, 7 (09) : 1070 - &
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[J]. JOURNAL OF SPACECRAFT AND ROCKETS, 1972, 9 (01) : 39 - &
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