ANALYTICAL REDUNDANCY AND THE DESIGN OF ROBUST FAILURE-DETECTION SYSTEMS

被引:691
作者
CHOW, EY [1 ]
WILLSKY, AS [1 ]
机构
[1] MIT,INFORMAT & DECIS SYST LAB,CAMBRIDGE,MA 02139
关键词
D O I
10.1109/TAC.1984.1103593
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:603 / 614
页数:12
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