SOME CONSIDERATIONS ABOUT ION TRAPPING BY TUBULAR ELECTRON BEAMS FOR COLLISION EXPERIMENTS

被引：4
作者：
HARTNAGEL, HL
机构：
来源：
INTERNATIONAL JOURNAL OF ELECTRONICS | 1966年 / 21卷 / 03期
关键词：
D O I：
10.1080/00207216608937911
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：277 / +
页数：1
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