RAMAN STUDIES ON LOCAL STRUCTURAL DISORDER IN SILICON-BASED AMORPHOUS-SEMICONDUCTOR FILMS

被引：47

作者：

MORIMOTO, A

OOZORA, S

KUMEDA, M

SHIMIZU, T

机构：

来源：

SOLID STATE COMMUNICATIONS | 1983年 / 47卷 / 10期

关键词：

D O I：

10.1016/0038-1098(83)90065-0

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：773 / 777

页数：5

共 15 条

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[6] DEFECTS IN HYDROGENATED AMORPHOUS SILICON-CARBON ALLOY-FILMS PREPARED BY GLOW-DISCHARGE DECOMPOSITION AND SPUTTERING [J].

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[7] ELECTRON-SPIN-RESONANCE AND IR STUDIES ON A-SI1-XGEX-H PREPARED BY GLOW-DISCHARGE DECOMPOSITION [J].

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[8]

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[9] NMR AND IR STUDIES ON HYDROGENATED AMORPHOUS SI1-XCX FILMS [J].

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[10] TOPOLOGY OF COVALENT NON-CRYSTALLINE SOLIDS .1. SHORT-RANGE ORDER IN CHALCOGENIDE ALLOYS [J].

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