SOLVING AN INTERFACE STRUCTURE BY ELECTRON-MICROSCOPY AND X-RAY-DIFFRACTION - THE GAAS(001)-CDTE(111) INTERFACE

被引：35
作者：
BOURRET, A
FUOSS, P
FEUILLET, G
TATARENKO, S
机构：
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] UNIV JOSEPH FOURIER,CNRS,SPECT PHYS LAB,GRENOBLE,FRANCE
来源：
PHYSICAL REVIEW LETTERS | 1993年 / 70卷 / 03期
关键词：
D O I：
10.1103/PhysRevLett.70.311
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
By a combination of high-resolution imaging and grazing-incidence x-ray diffraction at the GaAs(001)-CdTe(111) heterostructure we solve the atomic structure at the interface. We measure a square-root2(2x9) reconstructed unit cell and show that only three monolayers are involved in the interface relaxation. We deduce the first nearest neighbors of each atomic species at the interface and describe how they differ from the initial adsorbed layer on a bare GaAs(001) surface. This structure is compatible with two electrons per bond at any atom.
引用
收藏
页码：311 / 314
页数：4
相关论文
共 50 条
[41]   X-RAY-DIFFRACTION ANALYSIS OF THE IN GA AND IN AL INTERFACE DIFFUSION IN SUPERLATTICES (GAAS)(N)(INAS)(ALAS)(N) GAAS(001) AND (ALAS)(N)(INAS)(GAAS)(N) GAAS(001) [J].
FAYOS, J ;
PEREZMENDEZ, M .
JOURNAL OF SOLID STATE CHEMISTRY, 1993, 107 (02) :381-386
[42]   X-RAY-DIFFRACTION CHARACTERIZATION OF THE ENAMEL STEEL INTERFACE [J].
MACKERT, JR ;
CONNER, TG ;
RINGLE, RD ;
PARRY, EE ;
FAIRHURST, CW .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1992, 75 (11) :3087-3090
[43]   MBE GROWN GAAS ON GAAS (001) - UHV X-RAY-DIFFRACTION MEASUREMENTS [J].
BLOCH, R ;
BRUGEMANN, L ;
PRESS, W ;
TOLAN, M ;
BEHRENS, KM ;
OLDE, J ;
SKIBOWSKI, M .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1992, 4 (17) :4221-4232
[44]   X-RAY-DIFFRACTION FROM GAAS/ALAS/GAAS GROWN ON GAAS(001) BY MBE [J].
KASHIHARA, Y ;
IKEDA, K ;
HARADA, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (10) :2044-2045
[45]   CHARACTERIZATION OF THE GAP/SI(001) INTERFACE BY TRANSMISSION ELECTRON-MICROSCOPY [J].
PACHECO, FJ ;
KIELY, CJ ;
MOLINA, SI ;
ARAGON, G ;
GARCIA, R .
ELECTRON MICROSCOPY AND ANALYSIS 1993, 1993, (138) :317-320
[46]   CHARACTERIZATION OF INTERFACE STRUCTURE IN GAINAS/INP SUPERLATTICES BY MEANS OF X-RAY-DIFFRACTION [J].
MEYER, R ;
HOLLFELDER, M ;
HARDTDEGEN, H ;
LENGELER, B ;
LUTH, H .
JOURNAL OF CRYSTAL GROWTH, 1992, 124 (1-4) :583-588
[47]   SCANNING ELECTRON-MICROSCOPY AND X-RAY-DIFFRACTION STUDIES OF HUMAN-BONE OXALOSIS [J].
JAHN, H ;
FRANK, RM ;
VOEGEL, JC ;
SCHOHN, D .
CALCIFIED TISSUE INTERNATIONAL, 1980, 30 (02) :109-119
[48]   OXIDATION OF CARBONACEOUS MATTER .2. X-RAY-DIFFRACTION AND TRANSMISSION ELECTRON-MICROSCOPY [J].
JOSEPH, D ;
OBERLIN, A .
CARBON, 1983, 21 (06) :565-571
[49]   MOLECULAR ARRANGEMENT OF COLLAGEN FIBRILS - COMBINED STUDY BY X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY [J].
JESIOR, JC ;
MILLER, A ;
HULMES, DJS .
BIOLOGIE CELLULAIRE, 1980, 38 (03) :A12-A12
[50]   X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY STUDY OF THE NITROCELLULOSE-GLYCERINE FORMAL SYSTEM [J].
SVIRIDOV, AF ;
MYASNIKOVA, RM ;
TITOVA, EF ;
TSVANKIN, DY ;
PERTSIN, AI .
KRISTALLOGRAFIYA, 1984, 29 (02) :247-251
12345