PROGRESS AT IMGC IN THE ABSOLUTE DETERMINATION OF THE SILICON D(220) LATTICE SPACING

被引:33
作者
BASILE, G [1 ]
BERGAMIN, A [1 ]
CAVAGNERO, G [1 ]
MANA, G [1 ]
ZOSI, G [1 ]
机构
[1] UNIV TURIN,IST FIS GEN A AVOGADRO,I-10125 TURIN,ITALY
关键词
D O I
10.1109/19.192274
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:210 / 216
页数:7
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共 30 条
[1]  
ADE G, 1981, PTB APH14 PHYS TECHN
[2]   ON THE CONSTRUCTION OF A ZERODUR TRANSLATION DEVICE FOR X-RAY INTERFEROMETRIC SCANNING [J].
ALEMANNI, M ;
MANA, G ;
PEDROTTI, G ;
STRONA, PP ;
ZOSI, G .
METROLOGIA, 1986, 22 (01) :55-63
[3]   PRELIMINARY-RESULTS IN X-RAY INTERFEROMETRY AT "ISTITUTO-DI-METROLOGIA-G-COLONNETTI [J].
BASILE, G ;
BERGAMIN, A ;
OBERTO, M ;
ZOSI, G .
LETTERE AL NUOVO CIMENTO, 1978, 23 (09) :324-326
[4]   THE LATTICE-PARAMETER OF HIGHLY PURE SILICON SINGLE-CRYSTALS [J].
BECKER, P ;
SEYFRIED, P ;
SIEGERT, H .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1982, 48 (01) :17-21
[5]   ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL [J].
BECKER, P ;
DORENWENDT, K ;
EBELING, G ;
LAUER, R ;
LUCAS, W ;
PROBST, R ;
RADEMACHER, HJ ;
REIM, G ;
SEYFRIED, P ;
SIEGERT, H .
PHYSICAL REVIEW LETTERS, 1981, 46 (23) :1540-1543
[6]  
BECKER P, 1984, PRECISION MEASUREMEN, P303
[7]  
BERAMIN A, 1983, J PHYS E, V16, P96
[8]  
BERGAMIN A, 1983, CHINESE J LASERS, V10, P1609
[9]   AN X-RAY INTERFEROMETER [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&
[10]  
BONSE U, 1971, PRECISION MEASUREMEN, P291