NEW METHOD FOR THE STUDY OF MIRROR HEATING OF A SEMICONDUCTOR-LASER DIODE AND FOR THE DETERMINATION OF THERMAL-DIFFUSIVITY OF THE ENTIRE STRUCTURE

被引：19
作者：
BERTOLOTTI, M
LIAKHOU, GL
VOTI, RL
SIBILIA, C
SYRBU, A
WANG, RP
机构：
[1] Dipartimento Di Energetica, Università Roma I, Roma
来源：
APPLIED PHYSICS LETTERS | 1994年 / 65卷 / 18期
关键词：
D O I：
10.1063/1.112713
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A new method based on the photothermal deflection technique is described to determine the mirror temperature of a semiconductor laser diode as a function of intensity of drive current. The device's effective thermal diffusivity can also be measured. A short theoretical discussion is presented together with experimental measurements performed on three different kinds of laser diodes. (c) 1994 American Institute of Physics.
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页码：2266 / 2268
页数：3
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