THE FAULT DROPPING PROBLEM IN CONCURRENT EVENT-DRIVEN SIMULATION

被引：3

作者：

GAI, S ^{[1
]}

MONTESSORO, PL ^{[1
]}

机构：

[1] POLITECN TORINO, CNR, CENS, ITALIAN NATL RES COUNCIL, I-10129 TURIN, ITALY

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1991年 / 10卷 / 08期

关键词：

D O I：

10.1109/43.85734

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In many fault simulation applications it is not required to simulate each fault up to the end of the test pattern. For example, a fault can be removed after detection or being recognized hyperactive. A concurrent fault simulator must secure the efficient dynamic removal of faults. This process is called fault dropping (FD). The conventional technique is analyzed and compared with a proposed new one. The new technique is shown to have many advantages, the most important being reduction of the overall simulation CPU time.

引用

页码：968 / 971

页数：4