HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MICRODIFFRACTION

被引：14

作者：

COWLEY, JM

机构：

[1] Arizona State Univ, Dep of Physics,, Tempe, AZ, USA, Arizona State Univ, Dep of Physics, Tempe, AZ, USA

来源：

ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期

关键词：

This work was supportedb y NSF grandD MR-7926460a nd made use of the ASU Facility for High-Resolution Electron Microscopy; supported by NSF grant DMR-830651;

D O I：

10.1016/0304-3991(85)90117-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：11 / 17

页数：7

共 17 条

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[3] RECONSTRUCTION FROM IN-LINE HOLOGRAMS BY DIGITAL PROCESSING
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[4] COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION AND SHADOW IMAGING
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[5] NANODIFFRACTION FROM PLATELET DEFECTS IN DIAMOND
COWLEY, JM
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[6] FOURIER IMAGES .3. FINITE SOURCES
COWLEY, JM
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[7] ADJUSTMENT OF A STEM INSTRUMENT BY USE OF SHADOW IMAGES
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1979, 4 (04) : 413 - 418
[8] COWLEY JM, 1983, SCANNING ELECTRON MI, V1, P51
[9] MICROSCOPY BY RECONSTRUCTED WAVE-FRONTS
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[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1949, 197 (1051) : 454 - +
[10] A MATRIX BASIS FOR CBED PATTERN-ANALYSIS
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