ON THE POROSITY OF COLDLY CONDENSED SERS ACTIVE AG FILMS .1. CHARACTERIZATION OF THE FILMS BY MEANS OF XE ADSORPTION

被引：64
作者：
ALBANO, EV [1 ]
DAISER, S [1 ]
MIRANDA, R [1 ]
WANDELT, K [1 ]
机构：
[1] UNIV MUNICH, INST PHYS CHEM, D-8000 MUNICH 2, FED REP GER
来源：
SURFACE SCIENCE | 1985年 / 150卷 / 02期
关键词：
D O I：
10.1016/0039-6028(85)90653-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：367 / 385
页数：19
相关论文
共 42 条
[1]   ON THE POROSITY OF COLDLY CONDENSED SERS ACTIVE AG FILMS .2. COMPARISON OF ADSORPTION AND RAMAN-SCATTERING OF PYRIDINE [J].
ALBANO, EV ;
DAISER, S ;
MIRANDA, R ;
WANDELT, K .
SURFACE SCIENCE, 1985, 150 (02) :386-398
[2]   NATURE OF SURFACE-ENHANCED-RAMAN-SCATTERING ACTIVE-SITES ON COLDLY CONDENSED AG FILMS [J].
ALBANO, EV ;
DAISER, S ;
ERTL, G ;
MIRANDA, R ;
WANDELT, K ;
GARCIA, N .
PHYSICAL REVIEW LETTERS, 1983, 51 (25) :2314-2317
[3]   THE SURFACE STRUCTURE OF FILMS OF SILVER ON GLASS [J].
ALLPRESS, JG ;
SANDERS, JV .
JOURNAL OF CATALYSIS, 1964, 3 (06) :528-538
[4]   PHOTOELECTRIC WORK FUNCTION MEASUREMENTS ON NICKEL CRYSTALS AND FILMS [J].
BAKER, BG ;
JOHNSON, BB ;
MAIRE, GLC .
SURFACE SCIENCE, 1971, 24 (02) :572-&
[5]  
BEHM J, UNPUB
[6]  
BEHM J, P IVC9 ICSS 5 MADRID, P13
[7]   ELECTRONIC SURFACE-STATE CONTRIBUTION TO SURFACE ENHANCED RAMAN-SCATTERING [J].
BILLMANN, J ;
OTTO, A .
SOLID STATE COMMUNICATIONS, 1982, 44 (02) :105-107
[8]  
Chang R. K., 1982, SURFACE ENHANCED RAM
[9]  
DAISER S, 1983, SURF SCI, V128, pL213, DOI 10.1016/S0039-6028(83)80006-5
[10]   THICKNESS DEPENDENCE OF THE ELECTRICAL-RESISTIVITY OF EPITAXIALLY GROWN SILVER FILMS [J].
DAYAL, D ;
RUDOLF, P ;
WISSMANN, P .
THIN SOLID FILMS, 1981, 79 (02) :193-199
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