NOVEL TECHNIQUE TO MEASURE THE MICROWAVE RESPONSE OF HIGH-TC SUPERCONDUCTORS BETWEEN 4.2-K AND 200-K

被引：112
作者：
SRIDHAR, S
KENNEDY, WL
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 04期
关键词：
D O I：
10.1063/1.1139881
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：531 / 536
页数：6
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