A NEW HEMISPHERICAL RETARDING-FIELD ENERGY ANALYZER FOR QUANTITATIVE VOLTAGE MEASUREMENTS IN THE SEM

被引：0

作者：

NAKAMAE, K ^{[1
]}

FUJIOKA, H ^{[1
]}

URA, K ^{[1
]}

机构：

[1] OSAKA UNIV,FAC ENGN,ELECTRON BEAM LAB,SUITA,OSAKA 565,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1984年 / 33卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：261 / 261

页数：1

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