ALGEBRAIC-METHOD FOR EXTRACTING THIN-FILM OPTICAL-PARAMETERS FROM SPECTROPHOTOMETER MEASUREMENTS

被引：41
作者：
CASE, WE
机构：
来源：
APPLIED OPTICS | 1983年 / 22卷 / 12期
关键词：
D O I：
10.1364/AO.22.001832
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：1832 / 1836
页数：5
相关论文
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[4]   HILL-CLIMBING TECHNIQUES AS A METHOD OF CALCULATING OPTICAL CONSTANTS AND THICKNESS OF A THIN METALLIC FILM [J].
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