4-MICRON PERIOD ION-IMPLANTED BUBBLE TEST CIRCUITS

被引：1

作者：

NELSON, TJ ^{[1
]}

FRATELLO, VJ ^{[1
]}

MUEHLNER, DJ ^{[1
]}

ROMAN, BJ ^{[1
]}

SLUSKY, SEG ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1986年 / 22卷 / 02期

关键词：

D O I：

10.1109/TMAG.1986.1064278

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：93 / 100

页数：8

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