4-MICRON PERIOD ION-IMPLANTED BUBBLE TEST CIRCUITS

被引：1
|
作者：
NELSON, TJ [1 ]
FRATELLO, VJ [1 ]
MUEHLNER, DJ [1 ]
ROMAN, BJ [1 ]
SLUSKY, SEG [1 ]
机构：
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1986年 / 22卷 / 02期
关键词：
D O I：
10.1109/TMAG.1986.1064278
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：93 / 100
页数：8
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