PROBE MEASUREMENTS IN THE PLASMA BOUNDARY-LAYER

被引:82
作者
STAIB, P
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10.1016/0022-3115(82)90193-3
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T [工业技术];
学科分类号
08 ;
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页码:109 / 122
页数:14
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共 58 条
[1]  
Barnes C, COMMUNICATION
[2]  
BECKER G, 1981, IPP III75
[3]  
BEHRINGER K, COMMUNICATION
[4]  
CAMPBELL DJ, 1981, 6TH P INT C INFR MIL
[5]  
CHEN F. F., 1965, ELECT PROBES PLASMA
[6]   MODEL FOR HYDROGEN ISOTOPE BACKSCATTERING, TRAPPING AND DEPTH PROFILES IN CARBON AND AMORPHOUS SILICON [J].
COHEN, SA ;
MCCRACKEN, GM .
JOURNAL OF NUCLEAR MATERIALS, 1979, 84 (1-2) :157-166
[7]   MECHANISMS RESPONSIBLE FOR TOPOGRAPHICAL CHANGES IN PLT STAINLESS-STEEL AND GRAPHITE LIMITERS [J].
COHEN, SA ;
BUDNY, R ;
MCCRACKEN, GM ;
ULRICKSON, M .
NUCLEAR FUSION, 1981, 21 (02) :233-249
[8]   TOKAMAK PLASMA DIAGNOSIS BY SURFACE PHYSICS TECHNIQUES [J].
COHEN, SA .
JOURNAL OF NUCLEAR MATERIALS, 1978, 76-7 (1-2) :68-77
[9]   DEUTERIUM ION FLUXES TO PROBES IN THE PLT EDGE PLASMA [J].
COHEN, SA ;
DYLLA, HF ;
WAMPLER, WR ;
MAGEE, CW .
JOURNAL OF NUCLEAR MATERIALS, 1980, 93-4 (OCT) :109-114
[10]  
COHEN SA, 1980, J NUCL MAT, V94