MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION AS A PROBE OF ELASTIC STRAIN IN EPITAXIAL OVERLAYERS

被引：23

作者：

CHAMBERS, SA

VITOMIROV, IM

ANDERSON, SB

WEAVER, JH

机构：

[1] BOEING CO,CTR ELECTR HIGH TECHNOL,BOX 24969,MS9Z80,SEATTLE,WA 98124

[2] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.35.2490

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2490 / 2493

页数：4

共 10 条

[1] STRUCTURE AND GROWTH OF CRYSTALLINE SUPERLATTICES - FROM MONOLAYER TO SUPERLATTICE [J].

BAUER, E ;

VANDERMERWE, JH .

PHYSICAL REVIEW B, 1986, 33 (06) :3657-3671

[2] EPITAXY OF METALS ON METALS [J].

BAUER, E .

APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL) :479-494

[3] SURFACE-STRUCTURES OF METALLIC MONOLAYERS ON METAL CRYSTAL-SURFACES [J].

BIBERIAN, JP ;

SOMORJAI, GA .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06) :2073-2085

[4] ATOMIC-STRUCTURE OF THE CU/SI(111) INTERFACE BY HIGH-ENERGY CORE-LEVEL AUGER-ELECTRON DIFFRACTION [J].

CHAMBERS, SA ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1985, 32 (02) :581-587

[5] DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001) [J].

CHAMBERS, SA ;

CHEN, HW ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 33 (12) :8810-8813

[6] INCIDENT BEAM EFFECTS IN ANGLE-RESOLVED AUGER-ELECTRON SPECTROSCOPY [J].

CHAMBERS, SA ;

CHEN, HW ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 34 (05) :3055-3059

[7] ANGULAR DISTRIBUTION OF AUGER ELECTRONS [J].

CLEFF, B ;

MEHLHORN, W .

PHYSICS LETTERS A, 1971, A 37 (01) :3-&

[8]

FADLEY CS, 1984, PROGR SURFACE SCI, P327

[9]

Fink M, 1972, ATOM DATA, V4, P129

[10]

PENDRY JP, 1974, LOW ENERGY ELECTRON, P75

← 1 →