CALIBRATION AND USE OF A LITHIUM-DRIFTED SILICON DETECTOR FOR ACCURATE ANALYSIS OF X-RAY-SPECTRA

被引：17

作者：

KEITH, HD ^{[1
]}

LOOMIS, TC ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

关键词：

D O I：

10.1002/xrs.1300050210

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：93 / 103

页数：11

共 7 条

[1] SURFACE BARRIER STRUCTURES WITH VARIOUS METAL ELECTRODES [J].

INSKEEP, C ;

ELAD, E ;

SAREEN, RA .

LOOMIS, TC ;

KEITH, HD .

[3]

LOOMIS TC, 1975, XRAY SPECTROM, V5, P104

[4]

Reed S. J. B., 1973, XRAY SPECTROMETRY, V2, P69, DOI [10.1002/xrs.1300020206, DOI 10.1002/XRS.1300020206]

REED, SJB ;

WARE, NG .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (06) :582-&

WARE, NG ;

REED, SJB .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (03) :286-288

[7]

Warren B. E., 1969, XRAY DIFFRACTION