INFLUENCE OF SURFACE-DEFECTS ON CPM SPECTRA

被引：0

作者：

ASANO, A

ICHIKAWA, Y

SAKAI, H

机构：

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1993年 / 166卷

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We report on measurements and analysis of subband-gap absorption spectra for a-Si:H thin films by the constant photocurrent method (CPM) in two configurations : illumination from the film side and through the substrate. As in the case of PDS, the amplitude of the interference fringes was enhanced in the measurement from the film side, which means that, even in CPM measurement, the influence of surface defects has to be taken into account.

引用

收藏

页码：905 / 908

页数：4

相关论文

共 7 条

[1] PHOTOTHERMAL DETECTION OF SURFACE-STATES IN AMORPHOUS-SILICON FILMS [J].

AMATO, G ;

BENEDETTO, G ;

BOARINO, L ;

SPAGNOLO, R .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 50 (05) :503-507

[2] DEPTH PROFILING OF NONUNIFORM OPTICAL-ABSORPTION IN THIN-FILMS - APPLICATION TO HYDROGENATED AMORPHOUS-SILICON [J].

ASANO, A ;

STUTZMANN, M .

JOURNAL OF APPLIED PHYSICS, 1991, 70 (09) :5025-5034

[3] DEPTH PROFILING OF DEFECTS IN A-SI-H BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY [J].

ASANO, A ;

STUTZMANN, M .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 :623-626

[4] SURFACE-STATES AND IN-DEPTH INHOMOGENEITY IN A-SI-H THIN-FILMS - EFFECTS ON THE SHAPE OF THE PDS SUB-GAP SPECTRA [J].

GRILLO, G ;

DEANGELIS, L .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1989, 114 :750-752

[5] SYSTEMATIC STUDY OF THE INFLUENCE OF CONTACTS ON CPM RESULTS [J].

HOHEISEL, M ;

STIKA, O ;

KOCKA, J .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 :615-618

[6] DENSITY OF THE GAP STATES IN UNDOPED AND DOPED GLOW-DISCHARGE A-SI-H [J].

VANECEK, M ;

KOCKA, J ;

STUCHLIK, J ;

KOZISEK, Z ;

STIKA, O ;

TRISKA, A .

SOLAR ENERGY MATERIALS, 1983, 8 (04) :411-423

[7] ELECTRON-SPIN-RESONANCE AND CONSTANT PHOTOCURRENT STUDIES OF SURFACE AND BULK DEFECTS IN A-SI-H [J].

XU, XX ;

MORIMOTO, A ;

KUMEDA, M ;

SHIMIZU, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (11) :L1818-L1820