IONIZATION AND ELECTRON CAPTURE FOR HELIUM IONS INCIDENT ON NOBLE AND DIATOMIC GASES BETWEEN 10 AND 150 KEV

被引：28
作者：
DEHEER, FJ
SCHUTTEN, J
MOUSTAFA, H
机构：
来源：
PHYSICA | 1966年 / 32卷 / 10期
关键词：
D O I：
10.1016/0031-8914(66)90092-9
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：1793 / &
相关论文
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