ELECTRON-DIFFRACTION STUDY OF EPITAXIAL-FILMS OF CU2-XS

被引:8
|
作者
KAZINETS, MM [1 ]
IVANOVA, IV [1 ]
SHAFIZADE, RB [1 ]
机构
[1] ACAD SCI AZSSR,INST PHYS,BAKU,AZSSR
关键词
D O I
10.1016/0040-6090(77)90440-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:331 / 339
页数:9
相关论文
共 50 条
  • [41] ELECTRON-DIFFRACTION STUDY OF CONDENSATION PROCESS OF THIN SILVER FILMS
    BUNTAR, AG
    TKHORIVS.AM
    KRUPELNI.VA
    FIZIKA METALLOV I METALLOVEDENIE, 1974, 37 (04): : 790 - 795
  • [42] ELECTRON-DIFFRACTION STUDIES OF STRAIN IN EPITAXIAL BICRYSTALS AND MULTILAYERS
    CHERNS, D
    KIELY, CJ
    PRESTON, AR
    ULTRAMICROSCOPY, 1988, 24 (04) : 355 - 370
  • [43] ELECTRON-DIFFRACTION STUDY OF OXIDATION OF THIN SILICON AND TITANIUM FILMS
    IVANOVA, RS
    KORNILOVA, ZI
    IGNATOV, DV
    LAZAREV, EM
    RUSSIAN METALLURGY, 1975, (02): : 116 - 119
  • [44] AN ELECTRON-DIFFRACTION STUDY OF STRUCTURE OF THIN FILMS OF COPPER BROMIDE
    KURDYUMOVA, RN
    SEMILE.SA
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1966, 10 (05): : 529 - +
  • [45] ELECTRON-DIFFRACTION STUDY OF LOW-LOSS DIELECTRIC FILMS
    DUBEY, GC
    THIN SOLID FILMS, 1974, 24 (02) : 261 - 264
  • [46] Transformation from Cu2-xS Nanodisks to Cu2-xS@CuInS2 Heteronanodisks via Cation Exchange
    Lee, Seungyeol
    Baek, Seungmin
    Park, Joong Pill
    Park, Ju Hyun
    Hwang, Dae Yeon
    Kwak, Sang Kyu
    Kim, Sang-Wook
    CHEMISTRY OF MATERIALS, 2016, 28 (10) : 3337 - 3344
  • [47] ELECTRON-DIFFRACTION STUDY OF STACKING FAULTS IN THIN SILVER FILMS
    KOMNIK, YF
    SOVIET PHYSICS-SOLID STATE, 1964, 6 (03): : 672 - 676
  • [48] ELECTRON-DIFFRACTION STUDY OF TES FILMS OBTAINED BY VACUUM DEPOSITION
    ALIYEV, FI
    ISMAILOV, DI
    SHAFIZADE, RB
    KRISTALLOGRAFIYA, 1985, 30 (04): : 829 - +
  • [49] ELECTRON-DIFFRACTION STUDY OF AMORPHOUS SILICON-OXIDE FILMS
    GEORGE, CF
    DANTONIO, P
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (03) : 323 - 334
  • [50] The effect of complexing agent on crystal growth, structure and properties of nanostructured Cu2-xS thin films
    Yong-Juan Lu
    Jun-Hong Jia
    Chinese Chemical Letters, 2014, 25 (11) : 1473 - 1478