FABRICATION OF SUBMICROMETER MOSFETS USING GAS IMMERSION LASER DOPING (GILD)

被引:42
作者
CAREY, PG [1 ]
BEZJIAN, K [1 ]
SIGMON, TW [1 ]
GILDEA, P [1 ]
MAGEE, TJ [1 ]
机构
[1] XMR INC,SANTA CLARA,CA 95051
关键词
D O I
10.1109/EDL.1986.26429
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:440 / 442
页数:3
相关论文
共 4 条
[1]   ULTRA-SHALLOW HIGH-CONCENTRATION BORON PROFILES FOR CMOS PROCESSING [J].
CAREY, PG ;
SIGMON, TW ;
PRESS, RL ;
FAHLEN, TS .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (06) :291-293
[2]   VLSI PROCESS MODELING - SUPREM-III [J].
HO, CP ;
PLUMMER, JD ;
HANSEN, SE ;
DUTTON, RW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (11) :1438-1453
[3]  
KERN W, 1978, THIN FILM PROCESSES, P401
[4]   ELECTRICAL-PROPERTIES OF IMPLANTED AND RAPID THERMAL ANNEALED SHALLOW P+-N JUNCTIONS [J].
OZGUZ, VH ;
WORTMAN, JJ ;
HAUSER, JR ;
SIMPSON, L ;
LITTLEJOHN, MA ;
CHU, WK ;
ROZGONYI, GA .
APPLIED PHYSICS LETTERS, 1984, 45 (11) :1225-1226