ENERGETICS OF SILICIDE INTERFACE FORMATION

被引:39
作者
HAMANN, DR
MATTHEISS, LF
机构
关键词
D O I
10.1103/PhysRevLett.54.2517
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:2517 / 2520
页数:4
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[1]  
ALEXANDER H, 1979, J PHYS PARIS S, V6, P7
[2]   LINEAR METHODS IN BAND THEORY [J].
ANDERSEN, OK .
PHYSICAL REVIEW B, 1975, 12 (08) :3060-3083
[3]  
ANDERSEN OL, 1965, PHYSICAL ACOUSTICS B, V3
[4]   ELECTRONIC-STRUCTURE AND PROPERTIES OF NI-SI(001) AND NI-SI(111) REACTIVE INTERFACES [J].
BISI, O ;
CHIAO, LW ;
TU, KN .
PHYSICAL REVIEW B, 1984, 30 (08) :4664-4674
[5]   SELF-CONSISTENT ENERGY-BANDS AND BONDING OF NISI2 [J].
BYLANDER, DM ;
KLEINMAN, L ;
MEDNICK, K ;
GRISE, WR .
PHYSICAL REVIEW B, 1982, 26 (12) :6379-6383
[6]   SPECIAL POINTS IN BRILLOUIN ZONE [J].
CHADI, DJ ;
COHEN, ML .
PHYSICAL REVIEW B, 1973, 8 (12) :5747-5753
[7]   DIFFUSION-LAYER MICROSTRUCTURE OF NI ON SI(100) [J].
CHANG, YJ ;
ERSKINE, JL .
PHYSICAL REVIEW B, 1982, 26 (08) :4766-4769
[8]   LATTICE-LOCATION EXPERIMENT OF THE NI-SI INTERFACE BY THIN-CRYSTAL CHANNELING OF HELIUM-IONS [J].
CHEUNG, NW ;
MAYER, JW .
PHYSICAL REVIEW LETTERS, 1981, 46 (10) :671-674
[9]   STRUCTURE AND NUCLEATION MECHANISM OF NICKEL SILICIDE ON SI(111) DERIVED FROM SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE [J].
COMIN, F ;
ROWE, JE ;
CITRIN, PH .
PHYSICAL REVIEW LETTERS, 1983, 51 (26) :2402-2405
[10]   METAL-SILICON INTERFACE FORMATION - THE NI-SI AND PD-SI SYSTEMS [J].
GRUNTHANER, PJ ;
GRUNTHANER, FJ ;
MADHUKAR, A ;
MAYER, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :649-656