LIF FILMS - PRODUCTION AND CHARACTERIZATION

LiF films were produced by thermal evaporation onto amorphous substrates kept (during evaporation) at temperatures ranging from ambient up to 350-degrees-C. The evolution through two polycrystalline states was analysed by X-ray diffraction techniques, which also revealed that the LiF film lattice parameter is equal to that of LiF crystal. The refractive index of the produces films was measured by transmission optical interferometry. Talisurf-6 profilometer measurements on the film surface show sharp edges and very smooth surfaces, which reflect the substrate surfaces.