INSTRUMENTATION FOR MEASURING DOUBLE-LAYER CAPACITANCE AND SOLUTION RESISTANCE AT A QCM ELECTRODE

被引：0

作者：

PAUL, DW ^{[1
]}

BEELER, TL ^{[1
]}

CLARK, SR ^{[1
]}

机构：

[1] UNIV ARKANSAS,DEPT CHEM & BIOCHEM,FAYETTEVILLE,AR 72701

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1992年 / 203卷

关键词：

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暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：165 / ANYL

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