INSTRUMENTATION FOR MEASURING DOUBLE-LAYER CAPACITANCE AND SOLUTION RESISTANCE AT A QCM ELECTRODE

被引：0
作者：
PAUL, DW [1 ]
BEELER, TL [1 ]
CLARK, SR [1 ]
机构：
[1] UNIV ARKANSAS,DEPT CHEM & BIOCHEM,FAYETTEVILLE,AR 72701
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1992年 / 203卷
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D O I：
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：165 / ANYL
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