ROOM-TEMPERATURE ELECTRON TRAPPING IN AL0.35GA0.65AS/GAAS MODULATION-DOPED FIELD-EFFECT TRANSISTORS

被引:30
作者
NATHAN, MI
MOONEY, PM
SOLOMON, PM
WRIGHT, SL
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D O I
10.1063/1.96095
中图分类号
O59 [应用物理学];
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页码:628 / 630
页数:3
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共 13 条
[1]   COMPREHENSIVE ANALYSIS OF SI-DOPED ALXGA1-XAS (X=0 TO 1) - THEORY AND EXPERIMENTS [J].
CHAND, N ;
HENDERSON, T ;
KLEM, J ;
MASSELINK, WT ;
FISCHER, R ;
CHANG, YC ;
MORKOC, H .
PHYSICAL REVIEW B, 1984, 30 (08) :4481-4492
[2]   ON THE COLLAPSE OF DRAIN I-V-CHARACTERISTICS IN MODULATION-DOPED FETS AT CRYOGENIC TEMPERATURES [J].
FISCHER, R ;
DRUMMOND, TJ ;
KLEM, J ;
KOPP, W ;
HENDERSON, TS ;
PERRACHIONE, D ;
MORKOC, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (08) :1028-1032
[3]   TRAPPING CHARACTERISTICS AND A DONOR-COMPLEX (DX) MODEL FOR THE PERSISTENT PHOTOCONDUCTIVITY TRAPPING CENTER IN TE-DOPED ALXGA1-XAS [J].
LANG, DV ;
LOGAN, RA ;
JAROS, M .
PHYSICAL REVIEW B, 1979, 19 (02) :1015-1030
[4]  
LOREK L, 1983, P IEEE INT ELECTRON, V83, P107
[5]  
MOONEY PM, 1985, UNPUB APR P MAT RES
[6]  
MOONEY PM, 1985, I PHYS C SER, V74, P617
[7]   MOBILITY ENHANCEMENT IN INVERTED ALXGA1-XAS/GAAS MODULATION DOPED STRUCTURES AND ITS DEPENDENCE ON DONOR-ELECTRON SEPARATION [J].
MORKOC, H ;
DRUMMOND, TJ ;
THORNE, RE ;
KOPP, W .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (12) :L913-L916
[8]   PERSISTENT PHOTO-CONDUCTANCE AND PHOTOQUENCHING OF SELECTIVELY DOPED AL0.3GA0.7AS GAAS HETEROJUNCTIONS [J].
NATHAN, MI ;
JACKSON, TN ;
KIRCHNER, PD ;
MENDEZ, EE ;
PETTIT, GD ;
WOODALL, JM .
JOURNAL OF ELECTRONIC MATERIALS, 1983, 12 (04) :719-725
[9]  
ROCHETTE JF, 1982, I PHYS C SER, V65, P385
[10]   2-DIMENSIONAL ELECTRON-GAS AT A SEMICONDUCTOR-SEMICONDUCTOR INTERFACE [J].
STORMER, HL ;
DINGLE, R ;
GOSSARD, AC ;
WIEGMANN, W ;
STURGE, MD .
SOLID STATE COMMUNICATIONS, 1979, 29 (10) :705-709