USING ELNES WITH PARALLEL EELS FOR DIFFERENTIATING BETWEEN A-SI-X THIN-FILMS

被引：18

作者：

AUCHTERLONIE, GJ ^{[1
]}

MCKENZIE, DR ^{[1
]}

COCKAYNE, DJH ^{[1
]}

机构：

[1] UNIV SYDNEY,SCH PHYS,SYDNEY,NSW 2006,AUSTRALIA

来源：

ULTRAMICROSCOPY | 1989年 / 31卷 / 02期

关键词：

D O I：

10.1016/0304-3991(89)90216-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：217 / 222

页数：6

共 9 条

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