LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY

被引：80

作者：

PAWLEY, J ^{[1
]}

机构：

[1] UNIV WISCONSIN, HIGH VOLTAGE ELECTRON MICROSCOPE LAB, MADISON, WI 53706 USA

来源：

JOURNAL OF MICROSCOPY | 1984年 / 136卷 / OCT期

关键词：

D O I：

10.1111/j.1365-2818.1984.tb02545.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：45 / 68

页数：24

共 129 条

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