LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY

被引：80
作者：
PAWLEY, J [1 ]
机构：
[1] UNIV WISCONSIN, HIGH VOLTAGE ELECTRON MICROSCOPE LAB, MADISON, WI 53706 USA
来源：
JOURNAL OF MICROSCOPY | 1984年 / 136卷 / OCT期
关键词：
D O I：
10.1111/j.1365-2818.1984.tb02545.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：45 / 68
页数：24
相关论文
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