EFFECT OF NONUNIFORM CONDUCTIVITY ON BEHAVIOR OF GUNN EFFECT SAMPLES

被引:43
作者
HASTY, TE
STRATTON, R
JONES, EL
机构
[1] Texas Instruments Incorporated, Dallas
关键词
D O I
10.1063/1.1655812
中图分类号
O59 [应用物理学];
学科分类号
摘要
The behavior of n+-n-n+ GaAs samples biased at voltages below the threshold for the onset of Gunn effect is derived. In particular, the spatial distribution of the electric field and the electron temperature, along with the current-voltage characteristics of the sample, are calculated. The specific structure considered has a low conductivity region in the n layer near one of the n+ contacts. This occurs for an alloyed contact made to an epitaxial layer of n-type GaAs grown on an n+ GaAs substrate. The most striking result is the occurrence of Gunn oscillations for one direction of bias and avalanche breakdown for the other. This and other experimental findings are consistent with the theory. © 1968 The American Institute of Physics.
引用
收藏
页码:4623 / +
页数:1
相关论文
共 26 条
[1]   GUNN DOMAIN DYNAMICS [J].
ALLEN, JW ;
SHOCKLEY, W ;
PEARSON, GL .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (08) :3191-+
[2]   STABLE DOMAIN PROPAGATION IN GUNN EFFECT [J].
BUTCHER, PN ;
FAWCETT, W .
BRITISH JOURNAL OF APPLIED PHYSICS, 1966, 17 (11) :1425-&
[3]   CALCULATION OF VELOCITY-FIELD CHARACTERISTIC FOR GALLIUM ARSENIDE [J].
BUTCHER, PN ;
FAWCETT, W .
PHYSICS LETTERS, 1966, 21 (05) :489-&
[4]   INFRARED RADIATION FROM BULK GAAS - (DC PULSE EXCITATION - 9000 A - E) [J].
CHANG, KKN ;
LIU, SG ;
PRAGER, HJ .
APPLIED PHYSICS LETTERS, 1966, 8 (08) :196-&
[5]   EFFECT OF DISLOCATIONS ON BREAKDOWN IN SILICON P-N JUNCTIONS [J].
CHYNOWETH, AG ;
PEARSON, GL .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (07) :1103-1110
[6]   HIGH-FIELD TRANSPORT IN N-TYPE GAAS [J].
CONWELL, EM ;
VASSELL, MO .
PHYSICAL REVIEW, 1968, 166 (03) :797-+
[7]   STABLE SPACE-CHARGE LAYERS IN 2-VALLEY SEMICONDUCTORS [J].
COPELAND, JA .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) :3602-+
[8]   OHMIC CONTACTS FOR GAAS DEVICES [J].
COX, RH ;
STRACK, H .
SOLID-STATE ELECTRONICS, 1967, 10 (12) :1213-+
[9]   AVALANCHE INJECTION IN SEMICONDUCTORS [J].
GUNN, JB .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (08) :781-790
[10]   INSTABILITIES OF CURRENT IN 3-V SEMICONDUCTORS [J].
GUNN, JB .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1964, 8 (02) :141-&