MEASUREMENT OF DIFFUSION LENGTHS IN DIRECT-GAP SEMICONDUCTORS BY ELECTRON-BEAM EXCITATION

被引：257

作者：

WITTRY, DB

KYSER, DF

机构：

来源：

关键词：

D O I：

10.1063/1.1708984

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：375 / &

共 38 条

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