MEASUREMENT OF DIFFUSION LENGTHS IN DIRECT-GAP SEMICONDUCTORS BY ELECTRON-BEAM EXCITATION

[1] ANDERSEN CA, 1966, ELECTRON MICROPROBE, P58

[2] BIRKHOFF RD, 1958, HANDBUCH PHYSIK, V34, P135

[3] A MONTE CARLO CALCULATION ON SCATTERING OF ELECTRONS IN COPPER [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (547P): : 855 - &

[4] BLAKEMORE JS, 1962, SEMICONDUCTOR STATIS, P271

[5] BROWN DM, PRIVATE COMMUNICATIO

[6] BURKHALTER PG, 1965, RI6681 US BUR MIN IN

[7] CASEY HC, 1966, MAY EL SOC M CLEV

[8] CASTAING R, 1954, CR HEBD ACAD SCI, V238, P1506

[9] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[10] Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

[1] ANDERSEN CA, 1966, ELECTRON MICROPROBE, P58

[2] BIRKHOFF RD, 1958, HANDBUCH PHYSIK, V34, P135

[3] A MONTE CARLO CALCULATION ON SCATTERING OF ELECTRONS IN COPPER [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (547P): : 855 - &

[4] BLAKEMORE JS, 1962, SEMICONDUCTOR STATIS, P271

[5] BROWN DM, PRIVATE COMMUNICATIO

[6] BURKHALTER PG, 1965, RI6681 US BUR MIN IN

[7] CASEY HC, 1966, MAY EL SOC M CLEV

[8] CASTAING R, 1954, CR HEBD ACAD SCI, V238, P1506

[9] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[10] Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]