JET-IMPACT NEBULIZATION FOR SAMPLE INTRODUCTION IN INDUCTIVELY COUPLED PLASMA SPECTROMETRY

被引：25

作者：

DOHERTY, MP ^{[1
]}

HIEFTJE, GM ^{[1
]}

机构：

[1] INDIANA UNIV,DEPT CHEM,BLOOMINGTON,IN 47401

来源：

APPLIED SPECTROSCOPY | 1984年 / 38卷 / 03期

关键词：

D O I：

10.1366/0003702844555359

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

52

引用

收藏

页码：405 / 412

页数：8

相关论文

共 52 条

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[7] USE OF INDUCTIVELY COUPLED PLASMA OPTICAL-EMISSION SPECTROMETRY (ICP-OES) FOR THE ANALYSIS OF DOPED CADMIUM MERCURY TELLURIDE EMPLOYING A GRAPHITE ROD ELECTROTHERMAL VAPORIZATION DEVICE FOR SAMPLE INTRODUCTION
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[J]. ANALYST, 1982, 107 (1275) : 611 - 616
[8] EMISSION SPECTROSCOPY OF TRACE IMPURITIES IN POWDERED SAMPLES WITH A HIGH-FREQUENCY ARGON PLASMA TORCH
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[J]. ANALYTICA CHIMICA ACTA, 1971, 54 (03) : 397 - &
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[10] DONAHUE DL, 1978, ANAL CHEM, V50, P686

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