SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE

被引：809
|
作者：
SEILER, H
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 11期
关键词：
D O I：
10.1063/1.332840
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：R1 / R18
页数：18
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