INDIVIDUAL OXIDE TRAPS AS PROBES INTO SUB-MICRON DEVICES

被引：46

作者：

RESTLE, P

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 53卷 / 19期

关键词：

D O I：

10.1063/1.100378

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1862 / 1864

页数：3

共 14 条

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