共 7 条
[1]
Alov N. V., 1987, Soviet Technical Physics Letters, V13, P119
[4]
EYINK KG, 1985, APPL SURF SCI, V21, P29, DOI 10.1016/0378-5963(85)90005-4
[7]
SECONDARY-ELECTRON MEASUREMENT WITH AUGER-ELECTRON MICROPROBE .1. CALIBRATION OF THE CMA IN THE LOW-ENERGY REGION
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
1985, 24 (09)
:1145-1149