ROLE OF HYDROGEN-ATOMS IN THE FORMATION PROCESS OF HYDROGENATED MICROCRYSTALLINE SILICON

被引:59
作者
NOMOTO, K
URANO, Y
GUIZOT, JL
GANGULY, G
MATSUDA, A
机构
[1] ELECTROTECH LAB, TSUKUBA, IBARAKI 305, JAPAN
[2] TOKAI UNIV, HIRATSUKA, KANAGAWA 25912, JAPAN
[3] INDIAN ASSOC CULTIVAT SCI, CALCUTTA 700032, W BENGAL, INDIA
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 08期
关键词
Amorphous silicon; Film growth; Growth mechanism; Microcrystalline silicon; Plasma chemical vapor deposition;
D O I
10.1143/JJAP.29.L1372
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the role of hydrogen atoms in the formation process of the hydrogenated microcrystalline silicon (µc-Si:H) by using a layer-by-layer deposition technique in which an abundance of H atoms were supplied after the growth of every several monolayers of films. It has been found that whether or not µc-Si:H is formed is strongly dependent on the parameters (substrate temperature and waiting time before the growth of every several monolayers after H2plasma is turned off) which change the hydrogen coverage of the top surface. These experimental results illustrate the idea that the major role of H atoms for µc-Si:H formation is not to make “growth-zone” reactions below the top surface but to achieve sufficient hydrogen coverage of the top growing surface. © 1990 IOP Publishing Ltd.
引用
收藏
页码:L1372 / L1375
页数:4
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