AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIC AND ELECTROCHEMICAL CHARACTERIZATION OF TITANIUM THIN-FILM ELECTRODES

被引：162
作者：
ARMSTRONG, NR
QUINN, RK
机构：
[1] MICHIGAN STATE UNIV,DEPT CHEM,E LANSING,MI 48824
[2] SANDIA LABS,ALBUQUERQUE,NM 87115
来源：
SURFACE SCIENCE | 1977年 / 67卷 / 02期
关键词：
D O I：
10.1016/0039-6028(77)90007-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：451 / 468
页数：18
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