DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES

被引：677

作者：

SCHWIDER, J ^{[1
]}

BUROW, R ^{[1
]}

ELSSNER, KE ^{[1
]}

GRZANNA, J ^{[1
]}

SPOLACZYK, R ^{[1
]}

MERKEL, K ^{[1
]}

机构：

[1] JENOPTIK GMBH, JENA, GERMANY

来源：

关键词：

D O I：

10.1364/AO.22.003421

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3421 / 3432

页数：12

共 11 条

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[2] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES
BRUNING, JH
HERRIOTT, DR
GALLAGHER, JE
ROSENFELD, DP
WHITE, AD
BRANGACCIO, DJ
[J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703
[3] DORBAND B, 1982, OPTIK, V60, P161
[4] Grosso R. P., 1979, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V192, P65
[5] GUENTHER A, 1978, ASTM SPECIAL TECHNIC, V666
[6] AN AUTOMATED INTERFEROGRAM ANALYSIS TECHNIQUE
JONES, RA
KADAKIA, PL
[J]. APPLIED OPTICS, 1968, 7 (08): : 1477 - &
[7] Mahany R., 1979, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V192, P50
[8] Malacara D., 1992, OPTICAL SHOP TESTING, V2nd ed.
[9] Moore R. C., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V220, P75
[10] STUMPF KD, 1978, P SOC PHOTO-OPT INST, V153, P42