DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES

被引：681

作者：

SCHWIDER, J ^{[1
]}

BUROW, R ^{[1
]}

ELSSNER, KE ^{[1
]}

GRZANNA, J ^{[1
]}

SPOLACZYK, R ^{[1
]}

MERKEL, K ^{[1
]}

机构：

[1] JENOPTIK GMBH, JENA, GERMANY

来源：

APPLIED OPTICS | 1983年 / 22卷 / 21期

关键词：

D O I：

10.1364/AO.22.003421

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3421 / 3432

页数：12

共 11 条

[1]

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BRUNING, JH ;

HERRIOTT, DR ;

GALLAGHER, JE ;

ROSENFELD, DP ;

WHITE, AD ;

BRANGACCIO, DJ .

APPLIED OPTICS, 1974, 13 (11) :2693-2703

[3]

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[4]

Grosso R. P., 1979, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V192, P65

[5]

GUENTHER A, 1978, ASTM SPECIAL TECHNIC, V666

[6] AN AUTOMATED INTERFEROGRAM ANALYSIS TECHNIQUE [J].

JONES, RA ;

KADAKIA, PL .

APPLIED OPTICS, 1968, 7 (08) :1477-&

[7]

Mahany R., 1979, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V192, P50

[8]

Malacara D., 1992, OPTICAL SHOP TESTING, V2nd ed.

[9]

Moore R. C., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V220, P75

[10]

STUMPF KD, 1978, P SOC PHOTO-OPT INST, V153, P42

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