CLEAVED SI(111)2X1 SURFACE STUDIED BY MEV ION-SCATTERING

被引：1
|
作者：
ITO, T
ARISTOV, VY
GIBSON, WM
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1984年 / 2卷 / 02期
关键词：
D O I：
10.1116/1.572530
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：864 / 865
页数：2
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