REFRACTIVE-INDEX DISTRIBUTION MEASUREMENTS BY MEANS OF SPECTRALLY-RESOLVED WHITE-LIGHT INTERFEROMETRY

被引:20
|
作者
GUERRERO, AL [1 ]
SAINZ, C [1 ]
PERRIN, H [1 ]
CASTELL, R [1 ]
CALATRONI, J [1 ]
机构
[1] UNIV METROPOLITANA,DEPT FIS,CARACAS 1070A,VENEZUELA
来源
OPTICS AND LASER TECHNOLOGY | 1992年 / 24卷 / 06期
关键词
REFRACTIVE INDEX; TRANSPARENT MEDIA; INTERFEROMETRY; SPECTRAL ANALYSIS;
D O I
10.1016/0030-3992(92)90085-G
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new procedure to measure the spatial distribution of the refractive index in transparent media is presented. It is based on the spectral analysis of optical interferograms obtained from a wide, continuous-spectrum light source. The meth,od yields fairly high precision (up to 10(-8)) in the measurements of local values of differential refractive index, DELTAn (DELTAn = n - n(ref)), along a line in the sample. By means of a CCD TV-camera linked to a microcomputer, fast recording and automatic data processing are achieved. As an application, we present an experimental study of a thermal gradient in a liquid sample.
引用
收藏
页码:333 / 339
页数:7
相关论文
共 50 条
  • [1] Spectrally-resolved white-light interferometry as a profilometry tool
    Calatroni, J
    Guerrero, AL
    Sainz, C
    Escalona, R
    OPTICS AND LASER TECHNOLOGY, 1996, 28 (07): : 485 - 489
  • [2] Spectrally-resolved white-light interferometry as a profilometry tool
    Universidad Simon Bolivar, Caracas, Venezuela
    Opt Laser Technol, 7 (485-489):
  • [3] Crossed data processing in spectrally-resolved white-light interferometry
    Sainz, C
    Guerrero, AL
    OPTICAL INSPECTION AND MICROMEASUREMENTS II, 1997, 3098 : 62 - 72
  • [4] Spectrally-resolved white-light phase-shifted interferometry for 3D measurements of multilayer films
    Ghim, Young-Sik
    Rhee, Hyug-Gyo
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION XI, 2019, 11056
  • [5] Real-time dispersion curves measurement from spectrally-resolved white-light interferometry
    Calatroni, JE
    Sainz, C
    Guerrero, AL
    OPTICAL INSPECTION AND MICROMEASUREMENTS II, 1997, 3098 : 308 - 315
  • [6] Spectrally-resolved interferometry to measure thickness and refractive index of transparent material
    Wang, Jing
    Lu, Yang
    Sun, Xiongxin
    Yu, Liandong
    TENTH INTERNATIONAL SYMPOSIUM ON PRECISION MECHANICAL MEASUREMENTS, 2021, 12059
  • [7] Direct measurement of refractive-index dispersion of transparent media by white-light interferometry
    Galli, M
    Marabelli, F
    Guizzetti, G
    APPLIED OPTICS, 2003, 42 (19) : 3910 - 3914
  • [8] REFRACTOMETRY OF LIQUID SAMPLES WITH SPECTRALLY RESOLVED WHITE-LIGHT INTERFEROMETRY
    SAINZ, C
    CALATRONI, JE
    TRIBILLON, G
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1990, 1 (04) : 356 - 361
  • [9] Spectrally Resolved White Light Interferometry for NaCl Aqueous Solutions Refractive Index Measurement
    Likhachev, Igor G.
    Pustovoy, Vladimir, I
    Usievich, Boris A.
    FRONTIERS IN PHYSICS, 2021, 9
  • [10] Spectrally resolved white-light interferometry for measurement of ocular dispersion
    Hammer, DX
    Welch, AJ
    Noojin, GD
    Thomas, RJ
    Stolarski, DJ
    Rockwell, BA
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1999, 16 (09) : 2092 - 2102