INTENSITY VS TIME PROFILES OF PHOTOSTIMULATED EXOELECTRON EMISSION FROM SCRATCHED ALUMINUM

被引：6
作者：
SHIGEKAWA, H
HYODO, S
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1983年 / 22卷 / 10期
关键词：
D O I：
10.1143/JJAP.22.1493
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：1493 / 1495
页数：3
相关论文
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[4]   STORAGE EFFECT IN PHOTOSTIMULATED EXOELECTRON EMISSION FROM SCRATCHED ALUMINUM [J].
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1982, 21 (09) :1278-1282
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