SELF-CALIBRATION TECHNIQUE FOR A/D CONVERTERS

被引:28
作者
LEE, HS [1 ]
HODGES, DA [1 ]
机构
[1] UNIV CALIF BERKELEY,ELECTR LAB,BERKELEY,CA 94720
来源
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1983年 / 30卷 / 03期
关键词
D O I
10.1109/TCS.1983.1085339
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:188 / 190
页数:3
相关论文
共 6 条
[1]  
BOYACIGILLER ZG, 1981, ISSCC, V24, P62
[2]  
DOMOGALLA J, UNPUB ALGORITHMIC ER
[3]   SINGLE CHIP ALL-MOS 8-BIT A-D CONVERTER [J].
HAMADE, AR .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1978, 13 (06) :785-791
[4]  
MAIO K, 1981, IEEE T SOLID STATE C, V16
[5]   ALL-MOS CHARGE REDISTRIBUTION ANALOG-TO-DIGITAL CONVERSION TECHNIQUES .1. [J].
MCCREARY, JL ;
GRAY, PR .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (06) :371-379
[6]  
MCCREARY JL, 1979, IEEE T INSTRUM MEAS, V28