DETERMINATION OF THALLIUM IN TELLURIDE THERMOELECTRIC-MATERIAL BY CHEMICAL MODIFICATION AND ELECTROTHERMAL ATOMIC-ABSORPTION SPECTROMETRY

被引:9
作者
SRAMKOVA, J
KOTRLY, S
DOLEZALOVA, K
机构
关键词
THALLIUM; BISMUTH TELLURIDE; ELECTROTHERMAL ATOMIC ABSORPTION SPECTROMETRY; CHEMICAL MODIFIERS; TARTARIC ACID; ASCORBIC ACID; MAGNESIUM NITRATE;
D O I
10.1039/ja9951000763
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Interferences encountered in the determination of Tl as a dopant in layered monocrystals of Bi2Te3 were investigated. The atomic absorption signal for Tl was found to be influenced by a great excess of H2TeO3 and Bi(NO3)(3) obtained by dissolving milligram samples of the crystal in dilute HNO3. Interpretation of the influence of the pyrolysis temperature on the Tl signal and independent chemical examination indicated that the losses of Tl were caused by the volatility of TlNO3 above 300 degrees C. The sensitivity and reproducibility of the determination of Tl were also negatively influenced by a molten matrix and the volatility of Tl2O and TeO2, which probably participate in recombination reactions at the start of the atomization. These interfering effects were removed with the use of a chemical modifier consisting of an optimized mixture of tartaric acid, ascorbic acid and Mg(NO3)(2). The resulting changes in the thermal reactions were interpreted. For optimum conditions and, e.g., the peak-height absorbance, a linear calibration between 5 and 35 ng ml(-1) of Tl was obtained, allowing reliable determinations of 10-400 ppm of Tl. Estimates of the relative standard deviation were 1-3% and that of the 3s detection limit 0.6 ng ml(-1) or 12 pg per injection.
引用
收藏
页码:763 / 768
页数:6
相关论文
共 22 条
[1]   INVESTIGATIONS OF TRACE ANALYSIS OF AIIIBV SEMICONDUCTOR MICROSAMPLES BY ATOMIC SPECTROSCOPY .7. INVESTIGATION OF TRACE AND THIN-LAYER ANALYSIS OF DOPING ELEMENTS (AG, AU, BI, CD, SN, TL) IN INAS BY ATOMIC-ABSORPTION WITH ELECTROTHERMAL EVAPORATION [J].
DITTRICH, K ;
MOTHES, W ;
YUDELEVICH, IG ;
PAPINA, TS .
TALANTA, 1985, 32 (03) :195-201
[2]  
DUTTON WA, 1971, TELLURIUM, P100
[3]   CRITICAL-EVALUATION OF ANALYTICAL METHODS FOR DETERMINATION OF TRACE-ELEMENTS IN VARIOUS MATRICES - DETERMINATION OF TRACES OF THALLIUM IN VARIOUS MATRICES [J].
GRIEPINK, B ;
SAGER, M ;
TOLG, G .
PURE AND APPLIED CHEMISTRY, 1988, 60 (09) :1425-1436
[4]   ORGANIC COMPLEXING AGENTS IN ATOMIC-ABSORPTION SPECTROMETRY - A REVIEW [J].
KOMAREK, J ;
SOMMER, L .
TALANTA, 1982, 29 (03) :159-166
[5]   MICROANALYSIS OF BISMUTH INDIUM SELENIDE THERMOELECTRONIC MATERIALS BY X-RAY-FLUORESCENCE SPECTROMETRY WITH REFERENCE ASSAYS OF INDIUM [J].
KOTRLY, S ;
SRAMKOVA, J ;
CHADIMA, R ;
CERMAK, J .
ANALYST, 1993, 118 (01) :79-83
[6]  
Leloux M. S., 1987, Atomic Spectroscopy, V8, P71
[7]  
LELOUX MS, 1987, ATOM SPECTROSC, V8, P75
[8]   PREPARATION AND SOME PHYSICAL-PROPERTIES OF SB2TE3-XSEX SINGLE-CRYSTALS [J].
LOSTAK, P ;
NOVOTNY, R ;
BENES, L ;
CIVIS, S .
JOURNAL OF CRYSTAL GROWTH, 1989, 94 (03) :656-662
[9]   THE DETERMINATION OF THALLIUM WITH THE STABILIZED TEMPERATURE PLATFORM FURNACE AND ZEEMAN BACKGROUND CORRECTION [J].
MANNING, DC ;
SLAVIN, W .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1988, 43 (9-11) :1157-1165
[10]  
POHL B, 1993, LABOR PRAXIS, V17, P44