TIB2 CHARACTERIZATION BY AUGER-ELECTRON SPECTROSCOPY

被引：1

作者：

ADNOT, A ^{[1
]}

SPROULE, GI ^{[1
]}

DALLAIRE, S ^{[1
]}

CHAMPAGNE, B ^{[1
]}

机构：

[1] NATL RES COUNCIL CANADA,DIV CHEM,OTTAWA K1A 0R8,ONTARIO,CANADA

来源：

MATERIALS LETTERS | 1985年 / 3卷 / 5-6期

关键词：

D O I：

10.1016/0167-577X(85)90053-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：191 / 194

页数：4

共 13 条

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[3]

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[8] AUGER INVESTIGATION OF BORON-DOPED SIO2-SI [J].

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