SCANNING ELECTRON-MICROSCOPY - USE OF BACKSCATTERED ELECTRON IMAGE IN MATERIALS INVESTIGATIONS

被引：0

作者：

KISS, LT ^{[1
]}

BRINKIES, HG ^{[1
]}

机构：

[1] STATE ELECT COMMISS VICTORIA,HERMAN RES LAB,RICHMOND 3121,AUSTRALIA

来源：

JOURNAL OF THE AUSTRALASIAN INSTITUTE OF METALS | 1976年 / 21卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：178 / 182

页数：5

共 50 条

[1] DISAPPEARANCE OF TOPOGRAPHICAL CONTRAST IN THE BACKSCATTERED ELECTRON IMAGE IN SCANNING ELECTRON-MICROSCOPY
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[4] CONSTRUCTION AND USES OF AN EFFICIENT BACKSCATTERED ELECTRON DETECTOR FOR SCANNING ELECTRON-MICROSCOPY
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[5] Image contrast in the backscattered electron mode in scanning electron microscopy and microtomography
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[8] COMPARISON OF BACKSCATTERED SCANNING ELECTRON-MICROSCOPY AND MICRORADIOGRAPHY OF SECONDARY CARIES
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[9] USE OF THE CYTOCENTRIFUGE FOR ELECTRON-MICROSCOPY INVESTIGATIONS
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